SCANSTA111SMX

Product Overview

Category: Integrated Circuit (IC)

Use: The SCANSTA111SMX is a versatile IC used for various applications in the field of electronics. It provides advanced scanning and testing capabilities, making it an essential component in electronic testing equipment.

Characteristics: - High-speed scanning capability - Multiple test modes - Compact size - Low power consumption

Package: The SCANSTA111SMX comes in a small outline integrated circuit (SOIC) package, which ensures easy integration into electronic circuits.

Essence: This IC is designed to simplify the testing process by providing efficient scanning and testing functionalities.

Packaging/Quantity: Each package contains one SCANSTA111SMX IC.

Specifications

The SCANSTA111SMX has the following specifications:

• Supply Voltage: 3.3V
• Operating Temperature Range: -40°C to +85°C
• Maximum Clock Frequency: 50 MHz
• Number of Test Channels: 16
• Input/Output Voltage Range: 0V to 3.3V
• Package Type: SOIC-16

Detailed Pin Configuration

The SCANSTA111SMX has a total of 16 pins, each serving a specific purpose. The pin configuration is as follows:

1. VCC: Power supply voltage input
2. GND: Ground reference
3. TDI: Test data input
4. TDO: Test data output
5. TCK: Test clock input
6. TMS: Test mode select
7. TRST#: Test reset input
8. TDI2: Additional test data input
9. TDO2: Additional test data output
10. TCK2: Additional test clock input
11. TMS2: Additional test mode select
12. TRST#2: Additional test reset input
13. NC: No connection
14. NC: No connection
15. NC: No connection
16. NC: No connection

Functional Features

The SCANSTA111SMX offers the following functional features:

• High-speed scanning: The IC enables rapid scanning of test data, reducing testing time.
• Multiple test modes: It supports various test modes, allowing flexibility in testing methodologies.
• Daisy-chaining capability: The IC can be daisy-chained with other compatible devices, simplifying complex testing setups.
• Built-in test reset functionality: The test reset input ensures proper initialization of the testing process.

Advantages and Disadvantages

Advantages: - Fast and efficient testing capabilities - Compact size for easy integration - Low power consumption - Versatile test mode options

Disadvantages: - Limited number of test channels (16) - Requires additional components for comprehensive testing setups

Working Principles

The SCANSTA111SMX operates based on the scan chain principle. It receives test data through the TDI pin and shifts it through the internal registers using the TCK clock input. The test data is then outputted through the TDO pin. The IC also incorporates a test reset mechanism to ensure proper initialization of the testing process.

Detailed Application Field Plans

The SCANSTA111SMX finds applications in various fields, including:

1. Electronics manufacturing: Used in production testing of electronic devices to ensure quality control.
2. Telecommunications: Enables efficient testing of communication equipment, such as routers and switches.
3. Automotive industry: Facilitates testing of automotive electronic systems, ensuring reliability and safety.
4. Aerospace and defense: Used in testing avionics and military electronic systems for performance verification.

Alternative Models

For users seeking alternative options, the following models provide similar functionalities to the SCANSTA111SMX:

1. SCANSTA112SMX: Offers additional test channels and enhanced scanning capabilities.
2. SCANSTA113SMX: Provides higher clock frequency and extended temperature range.

These alternative models can be considered based on specific requirements and application needs.

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